Robert Hocken
Professor Motorsports
108 Duke Hall, UNCC Website: view website
email:
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Phone: 704-687-8496
Overview Academic/Research Interest Areas - Dimensional Metrology, Scanned Probe Microscopies
- Coordinate Measuring Machines
- Machine Tools and Machine Tool Metrology
Professional Affiliations - "Magnetically-suspended Stage for Accurate Positioning of Large Samples in Scanned Probe Microscopy", Proceedings of the MAG '98 Industrial Conference and Exhibition on Magnetic Bearings, Volume XXV, pp. 353-358, 1997.
- "Sampling Methods and Substitute Geometry Algorithms for Measuring Cylinders in a Coordinate Measuring Machine", Transactions of NAMRI/SME, pp. 23-32, 1998.
- "Thermal Imaging with Near-field Microscopy", Rev. Sci. Instruments, Vol.68, pp. 3096-3098, 1997.
- "Frontiers in Precision Manufacturing - Metrology", International Journal for Manufacturing Science and Production, 1997.
- "Self-calibration: Reversal, Redunancy, Error Separation and Absolute Testing", Annals of the CIRP, 45, 3, 1996.
What he/she brings to the industry - US Patent no. 4,714,339, "Three and Five Axis Tracking Systems", Dec. 1987
- US Patent no. 6,434,845, Dual-axis Static and Dynamic Force Characterization Device
- "Laser Polarimetric Roll Detector", submitted, March, 1993
- "Stabilized Diode Laser", submitted 1995
- "Fiber Optic White Light Interferometer", submitted 1997
- "Miniature CMM probes", submitted 2005
- "Laser system for large-scale metrology", submitted 2005
Recent Publications - "Magnetically-suspended Stage for Accurate Positioning of Large Samples in Scanned Probe Microscopy", Proceedings of the MAG '98 Industrial Conference and Exhibition on Magnetic Bearings, Volume XXV, pp. 353-358, 1997.
- "Sampling Methods and Substitute Geometry Algorithms for Measuring Cylinders in a Coordinate Measuring Machine", Transactions of NAMRI/SME, pp. 23-32, 1998.
- "Thermal Imaging with Near-field Microscopy", Rev. Sci. Instruments, Vol.68, pp. 3096-3098, 1997.
- "Frontiers in Precision Manufacturing - Metrology", International Journal for Manufacturing Science and Production, 1997.
- "Self-calibration: Reversal, Redunancy, Error Separation and Absolute Testing", Annals of the CIRP, 45, 3, 1996.
Research Grants - Laser Interferometry Timken (Equip. Donation) 30,000
- Two Sphere Spindle Analyzer Professional Instruments (Equip. Donation) 5,000
- Hewlett-Packard Laser Measurement System for Precision Engineering HP (Equip. Donation) 58,154
- Star Linear Systems Metrology Equipment SLS (Equip. Donation) 5,750
- Renishaw Inc. Machine Checking Gage Renishaw (Equip. Donation) 2,300
- Crotts & Saunders Fosdick Jig Borer and Surface Plate Crotts & Sanders (Equip. Donation) 19,000
- Coordinate Measuring Machine System Brown & Sharpe (Equip. Donation) 15,974
- Laser Measurement System Renishaw (Equip. Donation) 58,154
- Automatic Inspection Systems NCMS 63,373
- Enhance the Development of Performance of CMMs NSF 21,612
- Precision Engineering Guidelines NCMS 28,621
- Dimensional Inspection Techniques CAM-I 128,674
Educational Background - B.A. Physics, Oregon State University, 1968
- M.A. Physics, State University of New York at Stony Brook, 1969
- Ph.D. Physics, State University of New York at Stony Brook, 1973
- NBS-NRC Postdoctoral Fellow, 1973-75
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